The purpose of the course is to provide engineering graduate students, senior undergraduates and technical managers in surface and nanotechnology related materials industries an introductory course on modern materials characterization techniques, especially with respect of nanotechnology: Contact Angle, Surface Roughness, X-ray Photoelectron Spectroscopy, X-Ray Diffraction, Transmission Electron Microscopy, Auger Electron Spectroscopy , Scanning Tunneling Microscopy and Atomic Force Microscopy.
This course makes special effort to concentrate on principles and applications, leaving lengthy (and usually intimidating to engineering students) derivations and formulations out of the scope, thus engineering students can concentrate on basic principles (qualitative) and applications of these modern marvel technologies.
Objective and Scope
- Principles and applications
- Critical applications for materials today
- Industrial relevance
Surface and Structure Analysis
- Fundamentals
- Surface Analysis
- O, Ra, XPS, AES,SEM, STM, AFM,
- Structure Analysis
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